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Principal Metrology Engineer – PIC Wafer Fab

Nokia
USA
Full-time
Senior · 10+ years experience
Onsite
Discovered Today
Communication

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Qualifications

  • Qualifications
  • · MS in Electrical Engineering, Materials Science, Physics, or a related field.
  • · 10+ years of semiconductor wafer fabrication experience (7+ preferred).
  • · Strong problem-solving, data analysis, and communication skills.
  • · Experience with statistical process control (SPC), failure analysis, and process characterization.
  • · Hands-on experience with CD-SEM, profilometers, ellipsometers, and defect inspection tools preferred.
  • · Experience with MES systems is a plus.
  • · Experience in III-V semiconductor technologies (InP or GaAs) is highly desirable.
  • · Familiarity with photolithography, etch, deposition, and CVD processes preferred.
  • Work Schedule
  • Compressed work week: Monday-Wednesday and every other Thursday, 12-hour day or night shifts.

Responsibilities

  • Develop, qualify, and maintain metrology recipes for CD-SEM, profilometry, overlay, ellipsometry, and defect inspection tools.
  • · Own and support metrology equipment performance, qualification, and continuous improvement.
  • · Develop metrology sampling plans and inline monitoring strategies.
  • · Analyze process and metrology data to characterize processes and improve process control.
  • · Monitor SPC charts and investigate process excursions using RCCA methodologies.
  • · Support wafer-level failure analysis, including FIB, EDX, and coordination of external analyses.
  • · Troubleshoot process and equipment issues in collaboration with Operations and Engineering teams.
  • · Create equipment specifications, procedures, and OCAP documentation.
  • · Train operators and technicians on metrology tools and procedures.
  • · Support new technology development, process qualifications, technology transfers, and production ramp activities.

Preferred Qualifications

  • · 10+ years of semiconductor wafer fabrication experience (7+ preferred).
  • · Hands-on experience with CD-SEM, profilometers, ellipsometers, and defect inspection tools preferred.
  • · Experience with MES systems is a plus.
  • · Familiarity with photolithography, etch, deposition, and CVD processes preferred.

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